Angular Dependence of Multi-atom Resonant X-ray Raman Scattering
نویسندگان
چکیده
We study the polarization dependence of structure factor in multi-atom resonant X-ray Raman (MARX-Raman) scattering. The calculations for GaN (C3v) and SnO2 (C2v) show some preferable structures to enhance MARX-Raman signal intensity through which depends on relative arrangement incident surrounding local atomic geometry. theoretical help us derive new information from MARX-Raman.
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ژورنال
عنوان ژورنال: E-journal of Surface Science and Nanotechnology
سال: 2022
ISSN: ['1348-0391']
DOI: https://doi.org/10.1380/ejssnt.2022-033